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The effect of sample resistivity on Kelvin probe force microscopy
Wednesday, November 21, 2012 20:41
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(author unknown)
A. J. Weymouth and F. J. Giessibl
Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction. We have recently identified an effect, the Phantom force, which … [Appl. Phys. Lett. 101, 213105 (2012)] published Wed Nov 21, 2012.
2012-11-21 20:08:09
Source: http://nanochemistry.blogspot.com/2012/11/the-effect-of-sample-resistivity-on.html
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