| Story Views | |
| Now: | |
| Last Hour: | |
| Last 24 Hours: | |
| Total: | |
The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction
Wednesday, December 5, 2012 23:12
% of readers think this story is Fact. Add your two cents.
Where size matters
(author unknown)
M. Harb, C. von Korff Schmising, and H. Enquist et al.
We report on the use of time resolved X-ray diffraction to measure the dynamics of strain in laser-excited graphite film of nanometer thickness, obtained by chemical vapour deposition (CVD). Heat transport in the CVD film is simulated with a 1-dimensional heat diffusion model. We find the experime … [Appl. Phys. Lett. 101, 233108 (2012)] published Wed Dec 05, 2012.
2012-12-05 21:41:58
Source: http://nanochemistry.blogspot.com/2012/12/the-c-axis-thermal-conductivity-of.html
Source:
