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Far-field free tapping-mode tip-enhanced Raman microscopy
Thursday, March 28, 2013 13:34
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Jun Yu, Yuika Saito, and Taro Ichimura et al.
A tip-enhanced Raman scattering (TERS) microscope has been developed, which is based on the tapping-mode operation of atomic force microscopy. By synchronizing a multichannel detector with tapping oscillation of the metallic nanotip, one can measure a tip-sample separation dependent TERS spectrum … [Appl. Phys. Lett. 102, 123110 (2013)] published Thu Mar 28, 2013.
2013-03-28 13:19:20
Source: http://nanochemistry.blogspot.com/2013/03/far-field-free-tapping-mode-tip.html
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