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Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR04809E, Paper
A. B. Papandrew, Q. Li, M. B. Okatan, S. Jesse, C. Hartnett, S. V. Kalinin, R. K. Vasudevan
Variable temperature band-excitation atomic force microscopy in conjunction with I-V spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO4 during proton exchange induced by a Pt-coated conductive scanning probe.
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