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Where size matters
Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR06292F, Paper
Martijn van Sebille, Laurens J. P. van der Maaten, Ling Xie, Karol Jarolimek, Rudi Santbergen, Rene A. C. M. M. van Swaaij, Klaus Leifer, Miro Zeman
We propose a method to quickly detect and measure the nanocrystal size distribution from TEM images.
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