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Probing individual point defects in graphene via near-field Raman scattering

Thursday, November 5, 2015 3:58
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Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR04664E, Communication
Sandro Mignuzzi, Naresh Kumar, Barry Brennan, Ian S. Gilmore, David Richards, Andrew J. Pollard, Debdulal Roy
We demonstrate the capability of tip-enhanced Raman spectroscopy to probe individual point defects in graphene.
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