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Where size matters
Ruiwen Shao, Kun Zheng, and Yuefei Zhang et al.
In situ electrical measurement experiments were carried out in individual SiC nanowires (NWs) subjected to tensile strain using a transmission electron microscope. Fracture strain approaching 10% was achieved for a diamond-structure SiC NW with a 〈111〉 direction. With an increase in the tensile st … [Appl. Phys. Lett. 101, 233109 (2012)] published Wed Dec 05, 2012.
2012-12-05 21:41:58
Source: http://nanochemistry.blogspot.com/2012/12/piezoresistance-behaviors-of-ultra.html