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Spatial Modeling for Refining and Predicting Surface Potential Mapping with Enhanced Resolution
Thursday, December 20, 2012 16:24
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Where size matters
Xudong Wang
, 2012, Accepted Manuscript
DOI: 10.1039/C2NR33603K, Communication
Qiong Zhang, Xinwei Deng, Peter Z.G. Qian, Xudong Wang
Quantitatively mapping surface properties with nanometer or even subnanometer resolutions is critical for advanced scanning probe microscopy (SPM) characterization. However, the characterization performance is often suffered from noises and artifacts…
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2012-12-20 09:56:33
Source: http://nanochemistry.blogspot.com/2012/12/spatial-modeling-for-refining-and.html
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