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Bias controlled capacitive driven cantilever oscillation for high resolution dynamic force microscopy
Thursday, February 21, 2013 14:42
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Jinjin Zhang, Daniel M. Czajkowsky, and Yi Shen et al.
Well controlled cantilever oscillations are essential for precise measurements in dynamic force microscopy and spectroscopy, especially in demanding conditions such as under solution or at high frequencies. Here, we show that, with a capacitive driving system, an externally introduced DC-bias sign … [Appl. Phys. Lett. 102, 073110 (2013)] published Thu Feb 21, 2013.
2013-02-21 14:33:29
Source: http://nanochemistry.blogspot.com/2013/02/bias-controlled-capacitive-driven.html
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