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Vector magneto-optical generalized ellipsometry for sculptured thin films
Thursday, March 28, 2013 13:34
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Where size matters
(author unknown)
Daniel Schmidt, Chad Briley, and Eva Schubert et al.
Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperatu … [Appl. Phys. Lett. 102, 123109 (2013)] published Thu Mar 28, 2013.
2013-03-28 13:19:20
Source: http://nanochemistry.blogspot.com/2013/03/vector-magneto-optical-generalized.html
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