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Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR04885K, Paper
Nathan Eigenfeld, Jonas Gertsch, George Skidmore, Steven George, Victor M. Bright
Work presented here measures and interprets the electrical and thermal conductivities of atomic layer deposition (ALD) free-standing single film and periodic tungsten and aluminum oxide nanobridges with thicknesses from ~…
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