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High speed, high temperature electrical characterization of phase change materials: metastable phases, crystallization dynamics, and resistance drift

Thursday, October 8, 2015 7:29
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Nanoscale, 2015, 7,16625-16630
DOI: 10.1039/C5NR05512A, Communication
Faruk Dirisaglik, Gokhan Bakan, Zoila Jurado, Sadid Muneer, Mustafa Akbulut, Jonathan Rarey, Lindsay Sullivan, Maren Wennberg, Adrienne King, Lingyi Zhang, Rebecca Nowak, Chung Lam, Helena Silva, Ali Gokirmak
A high-speed, device-level characterization technique is developed to capture metastable electrical properties, crystallization and resistance drift behaviour.
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Source: http://nanochemistry.blogspot.com/2015/10/high-speed-high-temperature-electrical.html

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